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Tracking
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| Source | ID | Title |
|---|---|---|
EUVD |
EUVD-2018-5822 | There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605. |
No history.
Subscriptions
Status: PUBLISHED
Assigner: qualcomm
Published:
Updated: 2024-08-05T09:14:47.275Z
Reserved: 2018-07-11T00:00:00.000Z
Link: CVE-2018-13888
No data.
Status : Modified
Published: 2019-02-11T15:29:00.740
Modified: 2026-06-17T01:40:19.737
Link: CVE-2018-13888
No data.
OpenCVE Enrichment
No data.
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CWE-119
Improper Restriction of Operations within the Bounds of a Memory Buffer
EUVD